Dakota FX80 Benchtop Flaw Detector (DFX-8)
Product Description
Designed for use in the laboratory, these gauges are the tool you need for all your flaw detecting needs.
The Dakota FX80 Bench Top Ultrasonic Flaw Detector is available in two models: Dakota FX80-DL Bench Top Flaw Detector and Dakota FX81-DL Bench Top Flaw Detector.
The time corrected gain (TCG) feature automatically compensates for sound attenuation through a material, further increasing the performance of the gauge.
Within the grid batching of the Dakota FX80 Flaw Detector the user has the capability to enter ‘OBSTRUCT’ on to the grid for easy identification of inaccessible locations to measure.
The Dakota FX80 Ultrasonic Flaw Detector has a 6Gb internal memory and an external SD slot which allows up to 64Gb with full data logging via RS232 data output to DakMaster™ data management software.
Key Features
 |
Features:
|
Product Features
| Model | FX80-DL & FX81-DL |
| Display Mode | |
| Material thickness digits display | ■ |
| B-Scan cross sectional display | ■ |
| B-Scan with digits display | ■ |
| Scan bar display | ■ |
| Coating thickness display | ■ |
| A-Scan display | + Rectified, – Rectified, Full Waveform (RF) |
| Flaw Detection Modes | TRIG, DAC, AWS, TCG, AVG/DGS |
| Measurement Range | P-E: Pulse Echo (Dual Contact) : 0.630 – 2,440mm Pulse Echo (Single Contact) : 1.000 – 30,480mm E-E: Echo Echo ThruPaint™ (Dual Contact): 1.270 – 102mm Echo Echo (single delay line) : 0.178 – 25.4mm Echo Echo (single contact) : 1.000 – 3,050mm Echo Echo Verify (EEV): 1.270 – 25.4mm PETP: Pulse Echo Temp Comp: 0.630 – 2,440mm CT: Coating Thickness: 0.013 – 2.54mm PECT: Pulse Echo Coating Thickness (Coating) 0.010 – 2.54mm Pulse Echo Coating Thickness (Substr.) 0.630 – 2,440mm |
| Resolution | 0.01mm , 0.001mm selectable |
| Measurement Rate (Thickness Mode) | |
| Manual | 4 readings per second |
| Scan Mode | 32 readings per second |
| Scan bar display | 6 readings per second |
| High Speed Scan Mode | ■ |
| Differential Mode | ■ |
| Limit alarm mode | ■ |
| B-Scan display speed | adjustable display speed |
| Calibration setups | 64 user-definable setups transferrable to and from a PC archive |
| Gates | 2 (flaw) and 3 (thickness) adjustable gates: start, stop, width & threshold |
| Damping | 50, 75, 100, 300, 600, & 1500 ohms |
| Pulser type | FX80-DL: Two adjustable square wave pulsers, 100 – 200v FX81-DL:Two tone burst pulsers, 100 – 400v |
| Gain | Manual, automatic gain control (AGC) with 110dB range with 0.2dB resolution |
| Timing | Precision TCXO timing with single shot 100 MHz 8 bit ultra-low power digitizer |
| Memory and Data Logging | 4GB internal memory Sequential and grid logging Alpha numeric batch identification OBSTRUCT indicates inaccessible locations Bitmap graphic capture |
| Data Output | USB-C |
| Calibration Options | single, two point, velocity, material type |
| Transducer recognition | Automatic |
| V-path / dual path error correction | Automatic |
| Probe Zero | Automatic |
| Automatic Calibration | Longitudinal (straight), or Shear (angle) |
| Flaw Detection Product Features | |
| Probe Types | Single Contact, Dual, Delay & Angle |
| Material Velocity Table | Contains longitudinal and shear velocities for a variety of material types |
| TRIG | Trigonometric display of beam path, depth, surface distance, and curved surface correction. Used with angle beam transducers |
| DAC | Up to 8 points may be entered and used to digitally draw a DAC curve. Reference -2, -6, -10, (-6/-12), (-6/-14), (-2/-6/-10) dB. Amplitude displayed in %DAC, dB, or %FSH |
| AWS | Automatic defect sizing in accordance with AWS D1.1 structural welding code. |
| AVG/DGS | Automatic defect sizing using probe data. Stores up to 64 custom setups |
| TCG | Time corrected gain. 50 dB dynamic range, 20 dB per microsecond, up to 8 points for curve definition |
| Detection Modes | Zero Crossing, Flank and Peak |
| Display Freeze | Hold current waveform on screen |
| Peak Memory | Captures peak signal amplitude |
| PRF | 8 to 2000Hz in selectable steps (8, 16, 32, 66, 125, 250, 333, 1000, 2000Hz) |
| Skip Bar | Displays skip legs in the waveform area |
| Pulse Width | 40 to 400 ns. Selectable step options 40, 80 & 400 ns (labeled spike, thin & wide) |
| Frequency Bands | FX80-DL & FX81-DL: Broadband 1.8 – 19MHz (-3dB) FX81-DL: Six narrow bands at 0.5MHz, 1MHz, 2MHz, 5MHz, 10MHz, 15MHz. |
| Horizontal Linearity | +/- 0.4% FSW |
| Vertical Linearity | +/- 1% FSH |
| Amplifier Linearity | +/- 1 dB |
| Amplitude Measurement | 0 to 100% FSH, with 1% resolution |
| Delay | 0 – 999in (25,375mm) at steel velocity |
| Display | Blanview sunlight readable QVGA TFT colour display. 115.2 x 86.4mm viewable screen |
| Display Refresh Rate | 60Hz |
| Units (selectable) | mm |
| Backlight | Adjustable brightness |
| Repeatability / Stability Indicator | ■ |
| Low Battery Indicator | ■ |
| Battery Save Mode | Auto |
Technical Specifications
| Part Number | Description | Certificate |
| Z-250-0001 | Dakota FX80-DL Benchtop Flaw Detector (DFX-8) | ■ |
| Z-251-0001 | Dakota FX81-DL Benchtop Flaw Detector (DFX-8+) | ■ |
| Operating Temperature | -10 to 60ºC | |
| Power Supply | 6 x AA batteries and via USB | |
| Battery Life2 | Alkaline (12hrs), Nicad (5hrs), and NI-MH (12hrs) | |
| Gauge Weight | 2.04kg – including batteries | |
| Gauge Dimensions | 216.0 x 165.0 x 70.0mm |
● Certificate of Calibration supplied as standard
Data Sheet
Standards
Thickness Gauge: Factory calibration traceable to NIST & MIL-STD-45662A.
Flaw Detector: EN12668-1 compliant.
Part Numbers
| Dakota FX80-DL Benchtop Flaw Detector (DFX-8) | ||
 |
Part Number: | Z-250-0001 |
| Dakota FX81-DL Benchtop Flaw Detector (DFX-8+) | ||
 |
Part Number: | Z-251-0001 |
Packing List
| Packing List | Z-250-0001 | Z-251-0001 |
| Unit | ■ | ■ |
| Selectable Transducer | ■ | ■ |
| Couplant | ■ | ■ |
| Manual | ■ | ■ |
| Power Cable | ■ | ■ |
| Plastic Carrying case | ■ | ■ |
| Certificate of Calibration | ■ | ■ |
| AA Batteries | ■ | ■ |
| PC Software | ■ | ■ |
| Data Transfer Cable | ■ | ■ |
